Identification of stress factors and degradation mechanisms inducing DCR drift in SPADs
| Title: | Identification of stress factors and degradation mechanisms inducing DCR drift in SPADs |
|---|---|
| Authors: | Sicre, Mathieu; Federspiel, Xavier; Roy, David; Mamby, Bastien; Coutier, Caroline; Calmon, Francis |
| Source: | 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-5 Oct, 2022 |
| Relation: | 2022 IEEE International Integrated Reliability Workshop (IIRW) |
| Database: | IEEE Xplore Digital Library |