Effect of 20 MeV Electron Radiation on Long Term Reliability of SiC Power MOSFETs
| Title: | Effect of 20 MeV Electron Radiation on Long Term Reliability of SiC Power MOSFETs |
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| Authors: | Niskanen, K.; Kettunen, H.; Lahti, M.; Rossi, M.; Jaatinen, J.; Soderstrom, D.; Javanainen, A. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(4):456-461 Apr, 2023 |
| Database: | IEEE Xplore Digital Library |