Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFET
| Title: | Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFET |
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| Authors: | Niskanen, K.; Kettunen, H.; Soderstrom, D.; Rossi, M.; Jaatinen, J.; Javanainen, A. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(8):1838-1843 Aug, 2023 |
| Database: | IEEE Xplore Digital Library |