| Title: |
Reliability Comparison of Commercial Planar and Trench 4H-SiC Power MOSFETs |
| Authors: |
Zhu, Shengnan; Shi, Limeng; Jin, Michael; Qian, Jiashu; Bhattacharya, Monikuntala; Rao Maddi, Hema Lata; White, Marvin H.; Agarwal, Anant K.; Liu, Tianshi; Shimbori, Atsushi; Chen, Chingchi |
| Source: |
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023 |
| Relation: |
2023 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |