| Title: |
Unveiling Retention Physical Mechanism of Ge-rich GST ePCM Technology |
| Authors: |
Laurin, L.; Baldo, M.; Petroni, E.; Samanni, G.; Turconi, L.; Motta, A.; Borghi, M.; Serafini, A.; Codegoni, D.; Scuderi, M.; Ran, S.; Claverie, A.; Ielmini, D.; Annunziata, R.; Redaelli, A. |
| Source: |
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-7 Mar, 2023 |
| Relation: |
2023 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |