| Title: |
Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs |
| Authors: |
Shi, Limeng; Zhu, Shengnan; Qian, Jiashu; Jin, Michael; Bhattacharya, Monikuntala; White, Marvin H.; Agarwal, Anant K.; Shimbori, Atsushi; Liu, Tianshi |
| Source: |
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-7 Mar, 2023 |
| Relation: |
2023 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |