Influence of Free Layer Surface Roughness on Magnetic and Electrical Properties of 300 mm CMOS-Compatible MTJ Stacks
| Title: | Influence of Free Layer Surface Roughness on Magnetic and Electrical Properties of 300 mm CMOS-Compatible MTJ Stacks |
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| Authors: | Durner, C.; Lederer, M.; Gurieva, T.; Hertel, J.; Hindenberg, M.; Gerlich, L.; Wagner-Reetz, M.; Parkin, S. |
| Source: | IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 59(11):1-4 Nov, 2023 |
| Database: | IEEE Xplore Digital Library |