Technology Dependence of Stuck Bits and Single-Event Upsets in 110-, 72-, and 63-nm SDRAMs
| Title: | Technology Dependence of Stuck Bits and Single-Event Upsets in 110-, 72-, and 63-nm SDRAMs |
|---|---|
| Authors: | Soderstrom, D.; Luza, L.M.; de Mattos, A.M.P.; Gil, T.; Kettunen, H.; Niskanen, K.; Javanainen, A.; Dilillo, L. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(8):1861-1869 Aug, 2023 |
| Database: | IEEE Xplore Digital Library |