Investigation of drain noise in InP pHEMTs using cryogenic on-wafer characterization
| Title: | Investigation of drain noise in InP pHEMTs using cryogenic on-wafer characterization |
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| Authors: | Gabritchidze, Bekari; Cleary, Kieran; Readhead, Anthony; Minnich, Austin J. |
| Source: | 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023 Microwave Symposium - IMS 2023, 2023 IEEE/MTT-S International. :16-19 Jun, 2023 |
| Relation: | 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023 |
| Database: | IEEE Xplore Digital Library |