| Title: |
Intelligent Optical Microscopy Defects Assessment of Silicon-Carbide Power Modules embedded in Next Generation Electric Cars |
| Authors: |
Rundo, Francesco; Pino, Carmelo; Castagnolo, Giulia; Messina, Angelo Alberto; Spampinato, Concetto; Torrisi, Marco; Calabretta, Michele |
| Source: |
2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE), 2023 AEIT International Conference on. :1-6 Jul, 2023 |
| Relation: |
2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) |
| Database: |
IEEE Xplore Digital Library |