Role of the GaN-on-Si Epi-Stack on ΔRON Caused by Back-Gating Stress
| Title: | Role of the GaN-on-Si Epi-Stack on ΔRON Caused by Back-Gating Stress |
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| Authors: | Millesimo, M.; Borga, M.; Valentini, L.; Bakeroot, B.; Posthuma, N.; Vohra, A.; Decoutere, S.; Fiegna, C.; Tallarico, A.N. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(10):5203-5209 Oct, 2023 |
| Database: | IEEE Xplore Digital Library |