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Investigation into Current Sharing of Parallel SiC MOSFET Modules using a Gate-Driver with Sub-Nanosecond Time-Skew Capability

Title: Investigation into Current Sharing of Parallel SiC MOSFET Modules using a Gate-Driver with Sub-Nanosecond Time-Skew Capability
Authors: Neira, Sebastian; Mathieson, Ross; Parker, Mason; Judge, Paul D.; Finney, Stephen J.
Source: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) Power Electronics and Applications (EPE'23 ECCE Europe), 2023 25th European Conference on. :1-8 Sep, 2023
Relation: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)
Database: IEEE Xplore Digital Library