Hot-Carrier Degradation modeling of DCR drift in SPADs
| Title: | Hot-Carrier Degradation modeling of DCR drift in SPADs |
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| Authors: | Sicre, Mathieu; Roy, David; Calmon, Francis |
| Source: | ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2023 - IEEE 53rd European. :61-64 Sep, 2023 |
| Relation: | ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) |
| Database: | IEEE Xplore Digital Library |