| Title: |
Mind the Gap: The Difference Between Coverage and Mutation Score Can Guide Testing Efforts |
| Authors: |
Jain, Kush; Kalburgi, Goutamkumar Tulajappa; Le Goues, Claire; Groce, Alex |
| Source: |
2023 IEEE 34th International Symposium on Software Reliability Engineering (ISSRE) ISSRE Software Reliability Engineering (ISSRE), 2023 IEEE 34th International Symposium on. :102-113 Oct, 2023 |
| Relation: |
2023 IEEE 34th International Symposium on Software Reliability Engineering (ISSRE) |
| Database: |
IEEE Xplore Digital Library |