Analysis of SRAM PUF Integrity Under Ionizing Radiation: Effects of Stored Data and Technology Node
| Title: | Analysis of SRAM PUF Integrity Under Ionizing Radiation: Effects of Stored Data and Technology Node |
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| Authors: | Surendranathan, U.; Wilson, H.; Cao, L.R.; Milenkovic, A.; Ray, B. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(4):485-491 Apr, 2024 |
| Database: | IEEE Xplore Digital Library |