Modeling PEA Measurements of Arbitrary Layered Dielectrics Using the Ray-Trace Model
| Title: | Modeling PEA Measurements of Arbitrary Layered Dielectrics Using the Ray-Trace Model |
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| Authors: | Pearson, Anthony C.; Griffiths, Erick W.; Pearson, Lee H |
| Source: | 2023 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Electrical Insulation and Dielectric Phenomena (CEIDP), 2023 IEEE Conference on. :1-4 Oct, 2023 |
| Relation: | 2023 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) |
| Database: | IEEE Xplore Digital Library |