| Title: |
Bayesian In-Memory Computing with Resistive Memories |
| Authors: |
Turck, C.; Bonnet, D.; Harabi, K.-E.; Dalgaty, T.; Ballet, T.; Hirtzlin, T.; Pontlevy, A.; Renaudineau, A.; Esmanhotto, E.; Bessiere, P.; Droulez, J.; Laurent, R.; Bocquet, M.; Portal, J.-M.; Vianello, E.; Querlioz, D. |
| Source: |
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023 |
| Relation: |
2023 International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |