| Title: |
Status and Performance of Integration Modules Toward Scaled CMOS with Transition Metal Dichalcogenide Channel |
| Authors: |
Chou, Ang-Sheng; Hsu, Ching-Hao; Lin, Yu-Tung; Arutchelvan, Goutham; Chen, Edward; Hung, Terry Y.T.; Hsu, Chen-Feng; Chou, Sui-An; Lee, Tsung-En; Madia, Oreste; Doornbos, Gerben; Su, Yuan-Chun; Azizi, Amin; Sathaiya, D. Mahaveer; Cai, Jin; Wang, Jer-Fu; Chung, Yun-Yan; Wu, Wen-Chia; Neilson, Katie; Yun, Wei-Sheng; Hsu, Yu-Wei; Hsu, Ming-Chun; Hou, Fa-Rong; Shen, Yun-Yang; Chien, Chao-Hsin; Wu, Chung-Cheng; Wu, Jeff; Wong, H.-S. Philip; Chang, Wen-Hao; van Dal, Mark; Cheng, Chao-Ching; Wu, Chih-I; Radu, Iuliana P. |
| Source: |
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023 |
| Relation: |
2023 International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |