CHARM High-Energy Ions for Microelectronics Reliability Assurance (CHIMERA)
| Title: | CHARM High-Energy Ions for Microelectronics Reliability Assurance (CHIMERA) |
|---|---|
| Authors: | Bilko, K.; Alia, R.G.; Costantino, A.; Coronetti, A.; Danzeca, S.; Delrieux, M.; Emriskova, N.; Fraser, M.A.; Girard, S.; Johnson, E.P.; Sebban, M.; Ravotti, F.; Waets, A. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(8):1549-1556 Aug, 2024 |
| Database: | IEEE Xplore Digital Library |