Evaluating ATE features in terms of test escape rates and other cost of test culprits
| Title: | Evaluating ATE features in terms of test escape rates and other cost of test culprits |
|---|---|
| Authors: | Gatej, J.; Lee Song; Pyron, C.; Raina, R. |
| Source: | Proceedings. International Test Conference International test conference Test Conference, 2002. Proceedings. International. :1040-1049 2002 |
| Relation: | International Test Conference |
| Database: | IEEE Xplore Digital Library |