Scan and BIST can almost achieve test quality levels
| Title: | Scan and BIST can almost achieve test quality levels |
|---|---|
| Authors: | Pyron, C. |
| Source: | Proceedings. International Test Conference International test conference Test Conference, 2002. Proceedings. International. :1196 2002 |
| Relation: | International Test Conference |
| Database: | IEEE Xplore Digital Library |