On-Wafer Measurement of CPW with RDL Process for Substrate Effect in W-Band
| Title: | On-Wafer Measurement of CPW with RDL Process for Substrate Effect in W-Band |
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| Authors: | Sun, Chenhong; Sun, Liguo; Lin, Fujiang |
| Source: | 2023 Asia-Pacific Microwave Conference (APMC) Microwave Conference (APMC), 2023 Asia-Pacific. :101-103 Dec, 2023 |
| Relation: | 2023 Asia-Pacific Microwave Conference (APMC) |
| Database: | IEEE Xplore Digital Library |