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Development of micron-sized Ag-Si composite paste die attach material for highly stable microstructure during high temperate aging

Title: Development of micron-sized Ag-Si composite paste die attach material for highly stable microstructure during high temperate aging
Authors: Chen, Chuantong; Liu, Yang; Li, Wangyun; Ueshima, Minoru; Nakayama, Koji; Suganuma, Katsuaki
Source: 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) Electronics Packaging Technology Conference (EPTC), 2023 IEEE 25th. :548-551 Dec, 2023
Relation: 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC)
Database: IEEE Xplore Digital Library