Observation of Crack Formation Caused by Twisting in REBCO Coated Conductors by Using Scanning Hall-Probe Microscopy
| Title: | Observation of Crack Formation Caused by Twisting in REBCO Coated Conductors by Using Scanning Hall-Probe Microscopy |
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| Authors: | Inoue, M.; Kuga, H.; Koga, D.; Tsukahara, T.; Nakayama, Y.; Shiratsuchi, Y.; Sekito, S.; Miwa, A.; Yamada, Y. |
| Source: | IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 34(5):1-4 Aug, 2024 |
| Database: | IEEE Xplore Digital Library |