| Title: |
Low Frequency Noise Study of X-ray Irradiated Si/SiGe:C BiCMOS Technology Bipolar Transistors |
| Authors: |
Belie, A. Adebabay; El Beyrouthy, J.; Pascal, F.; Boch, J.; Maraine, T.; Hoffmann, A.; Bouhouche, M.; Sagnes, B.; Haendler, S.; Chevalier, P.; Gloria, D. |
| Source: |
2023 International Conference on Noise and Fluctuations (ICNF) Noise and Fluctuations (ICNF), 2023 International Conference on. :1-4 Oct, 2023 |
| Relation: |
2023 International Conference on Noise and Fluctuations (ICNF) |
| Database: |
IEEE Xplore Digital Library |