| Title: |
Gate-Source-Dependent Soft- and Hard-Switching Losses of 1200V SiC MOSFETs Utilizing Heatsinkless Calorimetric Measurements Based on Optical Sensors |
| Authors: |
Schnitzler, Ruben; Koch, Dominik; Weiser, Mathias C. J.; Weimer, Julian; Kallfass, Ingmar |
| Source: |
2024 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2024 IEEE. :1100-1107 Feb, 2024 |
| Relation: |
2024 IEEE Applied Power Electronics Conference and Exposition (APEC) |
| Database: |
IEEE Xplore Digital Library |