| Title: |
Comprehensive Reliability Assessment of 32Gb (Hf,Zr)O2-Based Ferroelectric NVDRAM |
| Authors: |
Ettisserry, Devanarayanan; Visconti, Angelo; Bonanomi, Mauro; Pazzocco, Riccardo; Locatelli, Andrea; Sebastiani, Alessandro; Chavan, Ashonita; Hollander, Matthew; Servalli, Giorgio; Calderoni, Alessandro; Ramaswamy, Nirmal |
| Source: |
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-8 Apr, 2024 |
| Relation: |
2024 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |