| Title: |
Investigation of the Electron Trapping in Commercial Thick Silicon Dioxides Thermally Grown on 4H-SiC under the Constant Current Stress |
| Authors: |
Qian, Jiashu; Shi, Limeng; Jin, Michael; Bhattacharya, Monikuntala; Yu, Hengyu; White, Marvin H.; Agarwal, Anant K.; Shimbori, Atsushi; Liu, Tianshi; Zhu, Shengnan |
| Source: |
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024 |
| Relation: |
2024 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |