| Title: |
Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection |
| Authors: |
Gobatto, Leonardo R.; Benevenuti, Fabio; Added, Nemitala; Alberton, Saulo G.; Macchione, Eduardo L. A.; Aguiar, Vitor A. P.; Medina, Nilberto H.; Kastensmidt, Fernanda L.; Azambuja, Jose Rodrigo |
| Source: |
2024 IEEE 25th Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2024 IEEE 25th. :1-6 Apr, 2024 |
| Relation: |
2024 IEEE 25th Latin American Test Symposium (LATS) |
| Database: |
IEEE Xplore Digital Library |