Investigating the Impact of Signal Resolution on Machine Learning Based Multi-Class Fault Detection
| Title: | Investigating the Impact of Signal Resolution on Machine Learning Based Multi-Class Fault Detection |
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| Authors: | Akin, Vehbi; Mete, Mutlu |
| Source: | 2024 IEEE 17th Dallas Circuits and Systems Conference (DCAS) Circuits and Systems Conference (DCAS), 2024 IEEE 17th Dallas. :1-4 Apr, 2024 |
| Relation: | 2024 IEEE 17th Dallas Circuits and Systems Conference (DCAS) |
| Database: | IEEE Xplore Digital Library |