Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?
| Title: | Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come? |
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| Authors: | Wenger, Y.; Meinerzhagen, B.; Issakov, V. |
| Source: | IEEE Access Access, IEEE. 12:78572-78588 2024 |
| Database: | IEEE Xplore Digital Library |