| Title: |
Enhancing Defect Recognition: Convolutional Neural Networks for Silicon Wafer Map Analysis |
| Authors: |
Junayed, Muhammad; Reza, Tanzeem Tahmeed; Islam, Md. Saiful |
| Source: |
2024 3rd International Conference on Advancement in Electrical and Electronic Engineering (ICAEEE) Advancement in Electrical and Electronic Engineering (ICAEEE), 2024 3rd International Conference on. :1-6 Apr, 2024 |
| Relation: |
2024 3rd International Conference on Advancement in Electrical and Electronic Engineering (ICAEEE) |
| Database: |
IEEE Xplore Digital Library |