Combining Built-In Redundancy Analysis with ECC for Memory Testing
| Title: | Combining Built-In Redundancy Analysis with ECC for Memory Testing |
|---|---|
| Authors: | Romain, Luc; Nordmann, Paul-Patrick; Nadeau-Dostie, Benoit; Schramm, Lori; Keim, Martin |
| Source: | 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-6 May, 2024 |
| Relation: | 2024 IEEE European Test Symposium (ETS) |
| Database: | IEEE Xplore Digital Library |