| Title: |
The impact of Electrical Signature Quality in NILM process: a preliminary analysis based on unsupervised approch |
| Authors: |
Tari, L.; Nardone, A.; Ferrigno, L.; Monti, A.; Ponci, F. |
| Source: |
2024 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT) Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT), 2024 IEEE International Workshop on. :88-93 May, 2024 |
| Relation: |
2024 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT) |
| Database: |
IEEE Xplore Digital Library |