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Correlation Between Conducted Injection and Near-Field Scan Immunity in the L-Band

Title: Correlation Between Conducted Injection and Near-Field Scan Immunity in the L-Band
Authors: Castagnet, Nicolas; Boyer, Alexandre; Escudie, Fabien
Source: 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa) Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa), 2024 IEEE Joint International Symposium on. :413-416 May, 2024
Relation: 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa)
Database: IEEE Xplore Digital Library