Fast Electromigration Stress Evolution Analysis Based on Relative Gain Array
| Title: | Fast Electromigration Stress Evolution Analysis Based on Relative Gain Array |
|---|---|
| Authors: | Meng, Zixuan; Yang, Xiaoman; Zhang, Yuhan; Zhu, Wenjie; Hou, Tianshu; Chen, Hai-Bao |
| Source: | 2024 2nd International Symposium of Electronics Design Automation (ISEDA) Electronics Design Automation (ISEDA), 2024 2nd International Symposium of. :410-415 May, 2024 |
| Relation: | 2024 2nd International Symposium of Electronics Design Automation (ISEDA) |
| Database: | IEEE Xplore Digital Library |