Physics-Informed Machine Learning for Robust Remaining Useful Life estimation of Power MOSFETs
| Title: | Physics-Informed Machine Learning for Robust Remaining Useful Life estimation of Power MOSFETs |
|---|---|
| Authors: | Fassi, Youssof; Heiries, Vincent; Boutet, Jerome; Boisseau, Sebastien |
| Source: | 2024 IEEE International Conference on Prognostics and Health Management (ICPHM) Prognostics and Health Management (ICPHM), 2024 IEEE International Conference on. :399-406 Jun, 2024 |
| Relation: | 2024 IEEE International Conference on Prognostics and Health Management (ICPHM) |
| Database: | IEEE Xplore Digital Library |