Stochastic Resonance in HfO₂-Based Memristors: Impact of External Noise on the Binary STDP Protocol
| Title: | Stochastic Resonance in HfO₂-Based Memristors: Impact of External Noise on the Binary STDP Protocol |
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| Authors: | Salvador, E.; Rodriguez, R.; Miranda, E.; Martin-Martinez, J.; Rubio, A.; Ntinas, V.; Sirakoulis, G.C.; Crespo-Yepes, A.; Nafria, M. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(9):5761-5766 Sep, 2024 |
| Database: | IEEE Xplore Digital Library |