Experimental and Numerical Analysis of Off-State Bias Induced Instabilities in Vertical GaN-on-Si Trench MOSFETs
| Title: | Experimental and Numerical Analysis of Off-State Bias Induced Instabilities in Vertical GaN-on-Si Trench MOSFETs |
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| Authors: | Zagni, N.; Fregolent, M.; Verzellesi, G.; Bergamin, F.; Favero, D.; De Santi, C.; Meneghesso, G.; Zanoni, E.; Huber, C.; Meneghini, M.; Pavan, P. |
| Source: | IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 39(11):14295-14303 Nov, 2024 |
| Database: | IEEE Xplore Digital Library |