Post-Damage Short Circuit Detection in Lithium-ion Batteries
| Title: | Post-Damage Short Circuit Detection in Lithium-ion Batteries |
|---|---|
| Authors: | Bhaskar, Kiran; Moon, Jihoon; Rahn, Christopher D. |
| Source: | 2024 American Control Conference (ACC) American Control Conference (ACC), 2024. :3486-3491 Jul, 2024 |
| Relation: | 2024 American Control Conference (ACC) |
| Database: | IEEE Xplore Digital Library |