| Title: |
Characterization of Monolithic CMOS Sensors with Internal Gain in a 110 nm Technology Node |
| Authors: |
Follo, U.; Bufalino, S.; Corradino, T.; Da Rocha Rolo, M. D.; Durando, S.; Ferrero, C.; Gioachin, G.; Mandurrino, M.; Mignone, M.; Pancheri, L.; Rivetti, A.; Wheadon, R. |
| Source: |
2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2024 IEEE. :1-1 Oct, 2024 |
| Relation: |
2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) |
| Database: |
IEEE Xplore Digital Library |