| Title: |
Multiple material decomposition with a combined X-ray spectral and phase imaging system |
| Authors: |
Arfelli, F.; Brombal, L.; Perion, P.; Brun, F.; Donato, S.; Sbuelz, L.; Delogu, P.; Oliva, P.; Menk, R.H. |
| Source: |
2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2024 IEEE. :1-2 Oct, 2024 |
| Relation: |
2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) |
| Database: |
IEEE Xplore Digital Library |