Experimental Investigation of Drain Noise in High Electron Mobility Transistors: Thermal and Hot Electron Noise
| Title: | Experimental Investigation of Drain Noise in High Electron Mobility Transistors: Thermal and Hot Electron Noise |
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| Authors: | Gabritchidze, B.; Chen, J.H.; Cleary, K.A.; Readhead, A.C.; Minnich, A.J. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(10):5925-5932 Oct, 2024 |
| Database: | IEEE Xplore Digital Library |