| Title: |
Advances in High-Resolution Non-Destructive Defect Detection and Localization Enhanced by Intelligent Signal Processing |
| Authors: |
Brand, Sebastian; Kogel, Michael; Grosse, Christian; Gounet, Pascal; Hollerith, Christian; Altmann, Frank |
| Source: |
2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) the Physical and Failure Analysis of Integrated Circuits (IPFA), 2024 IEEE International Symposium on. :1-8 Jul, 2024 |
| Relation: |
2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| Database: |
IEEE Xplore Digital Library |