| Title: |
Field Emitter Failure Mechanisms and Harsh Environment Robustness Studies |
| Authors: |
Bhattacharjee, Rushmita; Oberbeck, Cody; West, Jake; Segura Del Rio, Cesar Weasley; Chern, Winston; Karaulac, Nedeljko; Rughoobur, Girish; Turchetti, Marco; Yeung, Matthew; Nardi, Alberto; Britton, Wesley; Negro, Luca Dal; Bhattacharya, Ranajoy; Keathley, Phillip D.; Berggren, Karl. K.; Akinwande, Akintunde I.; Browning, Jim |
| Source: |
2024 Joint International Vacuum Electronics Conference and International Vacuum Electron Sources Conference (IVEC + IVESC) Vacuum Electronics Conference and International Vacuum Electron Sources Conference (IVEC + IVESC), 2024 Joint International. :1-2 Apr, 2024 |
| Relation: |
2024 Joint International Vacuum Electronics Conference and International Vacuum Electron Sources Conference (IVEC + IVESC) |
| Database: |
IEEE Xplore Digital Library |