Improvement of Thermal Stability in Dual Mechanism Memory Using HfxAl1-xO Blocking Layer for 3D V-NAND Flash Application
| Title: | Improvement of Thermal Stability in Dual Mechanism Memory Using HfxAl1-xO Blocking Layer for 3D V-NAND Flash Application |
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| Authors: | Chu, J.H.; Hun Kim, S.; Kang, C.; Joong Shin, E.; Jeong, J.; Park, Y.; Jin Cho, B. |
| Source: | IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(12):2375-2378 Dec, 2024 |
| Database: | IEEE Xplore Digital Library |