| Title: |
From Cloud to Edge: Black-Box Domain Adaptation for On-Device Machinery Fault Diagnosis via Noise-Robust Self-Supervised Learning |
| Authors: |
Zhu, Mengliang; Liu, Jie; Duan, Ran; Hu, Zhongxu; Ge, Mingfeng; Shi, Tielin |
| Source: |
2024 IEEE International Conference on Sensing, Diagnostics, Prognostics, and Control (SDPC) Sensing, Diagnostics, Prognostics, and Control (SDPC), 2024 IEEE International Conference on. :235-240 Jul, 2024 |
| Relation: |
2024 IEEE International Conference on Sensing, Diagnostics, Prognostics, and Control (SDPC) |
| Database: |
IEEE Xplore Digital Library |