Thermal Modeling and Degradation Profiling of E-Mode GaN HEMTs for Aging Characterization
| Title: | Thermal Modeling and Degradation Profiling of E-Mode GaN HEMTs for Aging Characterization |
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| Authors: | Sayed, H.; Krishnamoorthy, H.S. |
| Source: | IEEE Open Journal of Power Electronics IEEE Open J. Power Electron. Power Electronics, IEEE Open Journal of. 5:1720-1734 2024 |
| Database: | IEEE Xplore Digital Library |