| Title: |
Speeding-Up Emerging Device Development Cycles by Generating Models via Machine-Learning directly from Electrical Measurements |
| Authors: |
Trommer, J.; Reuter, M.; Bhattacharjee, N.; He, Y.; Sessi, V.; Drescher, M.; Zier, M.; Simon, M.; Ruttloff, K.; Li, K.; Zeun, A.; Seidel, A.-S.; Metze, C.; Grothe, M.; Jansen, S.; Galderisi, G.; Havel, V.; Slesazeck, S.; Hoentschel, J.; Hofmann, K.; Mikolajick, T. |
| Source: |
2024 IEEE European Solid-State Electronics Research Conference (ESSERC) Solid-State Electronics Research Conference (ESSERC), 2024 IEEE European. :217-220 Sep, 2024 |
| Relation: |
2024 IEEE European Solid-State Electronics Research Conference (ESSERC) |
| Database: |
IEEE Xplore Digital Library |