Enhancing Information Extraction in EMC Measurements through Artificial Intelligence
| Title: | Enhancing Information Extraction in EMC Measurements through Artificial Intelligence |
|---|---|
| Authors: | Stiemer, Marcus; Lange, Sven; Schroder, Dominik; Hedayat, Christian; Maalouly, Jad; Hemker, Dennis; Mathis, Harald |
| Source: | 2024 Smart Systems Integration Conference and Exhibition (SSI) Smart Systems Integration Conference and Exhibition (SSI), 2024. :1-5 Apr, 2024 |
| Relation: | 2024 Smart Systems Integration Conference and Exhibition (SSI) |
| Database: | IEEE Xplore Digital Library |